Acoustic Scanning Probe Microscopy [E-Book] / edited by Francesco Marinello, Daniele Passeri, Enrico Savio.
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive...
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Full text |
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Personal Name(s): | Marinello, Francesco. editor |
Passeri, Daniele. editor / Savio, Enrico. editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
2013
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Physical Description: |
XXV, 494 p. 239 illus., 73 illus. in color. online resource. |
Note: |
englisch |
ISBN: |
9783642274947 |
DOI: |
10.1007/978-3-642-27494-7 |
Series Title: |
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NanoScience and Technology
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Subject (LOC): |
- From the contents: Overview of acoustic techniques
- Contact dynamics modelling
- Cantilever dynamics: theoretical modeling
- Finite elements modelling
- AFAM calibration
- Enhanced sensitivity
- UAFM
- Holography calibration
- UFM
- Friction/lateral techniques
- Harmonix
- Scanning microdeformation microscopy (SMM)
- Tip wear
- Comparison with other techniques
- Applications polymer
- Thin films.