Ellipsometry of Functional Organic Surfaces and Films [E-Book] / edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces,...
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Full text |
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Personal Name(s): | Hinrichs, Karsten. editor |
Eichhorn, Klaus-Jochen. editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
2014
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Physical Description: |
XXI, 363 p. 216 illus., 55 illus. in color. online resource. |
Note: |
englisch |
ISBN: |
9783642401282 |
DOI: |
10.1007/978-3-642-40128-2 |
Series Title: |
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Springer Series in Surface Sciences ;
52 |
Subject (LOC): |
- Biomolecules at surfaces
- Smart polymer surfaces and films
- Nanostructured surfaces and organic/inorganic hybrids
- Thin films of organic semiconductors for OPV, OLEDs and OTFT
- Developments in ellipsometric real-time/in-situ monitoring techniques
- Infrared brillant light sources for micro-ellipsometric studies of organic films
- Collection of optical constants of organic layers.