Noncontact Atomic Force Microscopy [E-Book] : Volume 3 / edited by Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger.
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applica...
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Personal Name(s): | Giessibl, Franz J. editor |
Meyer, Ernst. editor / Morita, Seizo. editor / Wiesendanger, Roland. editor | |
Imprint: |
Cham :
Springer,
2015
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Physical Description: |
XXII, 527 p. 256 illus., 159 illus. in color. online resource. |
Note: |
englisch |
ISBN: |
9783319155883 |
DOI: |
10.1007/978-3-319-15588-3 |
Series Title: |
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NanoScience and Technology
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Subject (ZB): | |
Subject (LOC): |
- From the Contents: Introduction
- 3D Force-Field Spectroscopy
- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts
- Spectroscopy and Manipulation Using AFM/STM at Room Temperature
- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy
- Non-Contact Friction
- Magnetic Exchange Force Spectroscopy.