Quantitative microbeam analysis : Scottish universities summer school in physics 0040: proceedings : NATO advanced study institute : SUSSP 0040: proceedings : Dundee, 16.08.92-04.09.92.
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Personal Name(s): | Fitzgerald, A. G., editor |
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Imprint: |
Edinburgh :
Scottish Universities Summer School in Physics,
1993.
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Physical Description: |
XIV, 478 S. |
Note: |
englisch |
ISBN: |
0750302569 9780750302562 |
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Scottish Universities Summer School in Physics ;
0040. |
Keywords: |
quantification in AES and XPS surface analytical imaging electronic structure and electron spectroscopy Auger electron spectroscopy in the STEM electron energy loss spectroscopy (EELS) light element microanalysis and imaging a comparison of quantification methods and analytical techniques microbeam analysis: data analysis and processing microscopy and microanalysis of insulating materials microbeam analysis: electron/specimen interactions electron probe x-ray microanalysis energy dispersive x-ray analysis (EDX) in the TEM/STEM analysis and imaging by proton induced x-ray emission (PIXE) ion beam analytical techniques: Rutherford backscattering (RBS), elastic recoil (ERDA) and nuclear reaction analysis (NRA) quantitative analysis of solids by SIMS and SNMS static SIMS applications of surface, interface and thin film analysis in an industrial research laboratory ion induced Auger electron emission from solids resonance ionization mass spectrometry (RIMS) |
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Reading Room Call number: FHJ 024 Barcode: 1093103915 Available |