Defect recognition and image processing in III-V compounds. 0002 : International symposium on defect recognition and image processing in III-V compounds. 0002: proceedings : DRIP. 0002: proceedings : Monterey, CA, 27.04.87-29.04.87.
Defect characterization and image processing in iii-v semiconductors :
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Personal Name(s): | Weber, E. R., editor |
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Imprint: |
Amsterdam :
Elsevier,
1987.
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Physical Description: |
X, 320 S. |
Note: |
englisch |
ISBN: |
0444428925 9780444428929 |
Series Title: |
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Materials science monographs ;
vol 0044. |
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Classification: |
ZB | |
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