Ultrafast lasers probe phenomena in bulk and microstructure semiconductors: proceedings : Bay-Point, FL, 25.03.87-26.03.87 / Robert R. Alfano (editor)
Saved in:
Personal Name(s): | Alfano, Robert R., editor |
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Imprint: |
Bellingham, WA :
SPIE-The International Society for Optical Engineering,
1987
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Physical Description: |
VI, 194 Seiten |
Note: |
englisch |
ISBN: |
0892528281 9780892528288 |
Series Title: |
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Proceedings of SPIE-The International Society for Optical Engineering ;
793 |
Keywords: |
transient effects |
Classification: |
ZB | |
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Open Stacks Call number: S 002308-0793'01' Barcode: 1088103387 Available |