Sitzung des Arbeitskreises Rastermikroskopie. 0008: Vorträge : Berlin, 11.10.77-12.10.77.
Saved in:
Personal Name(s): | Schaaber, O., editor |
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Imprint: |
Deutscher Verband für Materialprüfung,
1978.
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Physical Description: |
262 S. |
Note: |
deutsch |
Series Title: |
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Sitzung des Arbeitskreises Rastermikroskopie ;
0008. |
Keywords: |
scanning electron microscopy : material testing |
Classification: |
ZB | |
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