Scanning electron microscopy. 1984,4 : Philadelphia, PA, 15.04.1984-20.04.1984 : An international journal of scanning electron microscopy, related techniques, and applications.
Saved in:
Personal Name(s): | Becker, R. P., editor |
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Imprint: |
AMF-O'Hare, IL :
Scanning Electron Microscopy,
1984.
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Physical Description: |
XXIII, S. 1461-2075. |
Note: |
englisch |
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Scanning electron microscopy ;
1984,4. |
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ZB | |
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Open Stacks Call number: S 003531-1984,4'01' Barcode: 1085003582 Available |