Microscopic identification of electronic defects in semiconductors: symposium : Spring meeting of the Materials Research Society. 1985 : San-Francisco, CA, 15.04.1985-18.04.1985.
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Personal Name(s): | Johnson, N. M., editor |
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Imprint: |
Pittsburgh, PA :
Materials Research Society,
1985.
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Physical Description: |
XV, 604 S. |
Note: |
englisch |
ISBN: |
9780931837111 0931837111 |
Series Title: |
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Materials Research Society symposia proceedings ;
46. |
Keywords: |
crystal defect in semiconductors : defect analysis |
Classification: | |
Shelf Classification: |