Reliability physics 1985: symposium : Orlando, FL, 26.03.85-28.03.85.
Saved in:
Imprint: |
New-York, NY :
Institute of Electrical and Electronics Engineers,
1985.
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Physical Description: |
VIII, 252 S. |
Note: |
englisch |
Series Title: |
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"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
Annual proceedings reliability physics ;
vol 0023. |
Keywords: |
microelectronics : physical aspect : reliability |
Subject (ZB): | |
Classification: |
ZB | |
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Open Stacks Call number: S 002214-0023'01' Barcode: 1087002385 Available |