IEEE / Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits: proceedings : Ithaca, NY, 07.08.89-09.08.89.
Wafer scale integration
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Personal Name(s): | Bozler, C. O., editor |
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Imprint: |
New-York, NY :
Institute of Electrical and Electronics Engineers,
1989.
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Physical Description: |
VI, 398 S. |
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englisch |
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IEEE / Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits: proceedings.
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Open Stacks Call number: B 065573'01'-1989 Barcode: 1091103409 Available |