Symposium on electron metallography: papers : Annual meeting of the American Society for Testing Materials 0062 : Atlantic-City, NJ, 23.06.59.
electron microscopy in metallography :
Saved in:
Imprint: |
Philadelphia, PA :
American Society for Testing and Materials,
1960.
|
---|---|
Physical Description: |
128 S. |
Note: |
englisch |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
ASTM special technical publication ;
vol 0262. |
Subject (ZB): | |
Classification: |
ZB | |
---|---|
Open Stacks Call number: S 000167-0262'01' Barcode: 1061001724 Available |