Annual conference on applications of X-ray analysis. Denver, CO, 07.08.63-09.08.63 / W. M. Mueller (Hrsg.) 12. Proceedings :

Saved in:
Mueller, W. M., (editor)
New-York, NY : Plenum Pr., 1964
X, 662 S., Farbtaf., Falttaf.
englisch
Advances in X-ray analysis ; 7
x-ray analysis
x-ray spectroscopy
x-ray diffraction
electron microprobe analysis
x-ray fluorescence analysis

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