Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [E-Book] : Application to Rough and Natural Surfaces / by Gerd Kaupp.
Kaupp, Gerd. (author)
Berlin, Heidelberg : Springer, 2006
XII, 292 p. online resource.
englisch
9783540284727
10.1007/978-3-540-28472-7
Full Text
Table of Contents:
  • Atomic Force Microscopy
  • Scanning Near-Field Optical Microscopy
  • Nanoindentation
  • Nanoscratching.