Applied Scanning Probe Methods VIII [E-Book] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...
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Full text |
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Personal Name(s): | Bhushan, Bharat. editor |
Fuchs, Harald. editor / Tomitori, Masahiko. editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
2008
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Physical Description: |
LIX, 465 p. online resource. |
Note: |
englisch |
ISBN: |
9783540740803 |
DOI: |
10.1007/978-3-540-74080-3 |
Series Title: |
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Nano Science and Technolgy
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Subject (LOC): |
- Background-Free Apertureless Near-Field Optical Imaging
- Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes
- Near Field Probes: From Optical Fibers to Optical Nanoantennas
- Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging
- Scanning Probes for the Life Sciences
- Self-Sensing Cantilever Sensor for Bioscience
- AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication
- Cantilever Spring-Constant Calibration in Atomic Force Microscopy
- Frequency Modulation Atomic Force Microscopy in Liquids
- Kelvin Probe Force Microscopy: Recent Advances and Applications
- Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale
- Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.