Noncontact Atomic Force Microscopy [E-Book] / edited by S. Morita, R. Wiesendanger, E. Meyer.
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resoluti...
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Full text |
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Personal Name(s): | Meyer, E., editor |
Morita, S., editor / Wiesendanger, R., editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
2002
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Physical Description: |
XVIII, 440 p. online resource. |
Note: |
englisch |
ISBN: |
9783642560194 |
DOI: |
10.1007/978-3-642-56019-4 |
Series Title: |
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NanoScience and Technology
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Subject (ZB): | |
Subject (LOC): |
- Introduction
- Principles of NC-AFM
- Semiconductor Surfaces
- Bias Dependence of NC-AFM Images and Tunneling Current Variations on Semiconductors
- Alkali Halides
- Atomic Resolution Imaging on Fluorides
- Atomically Resolved Imaging of a NiO(001) Surface
- Atomic Structure, Order and Disorder of High-Temperature Reconstructed alpha-Al2O3(0001)
- NC-AFM Imaging of Surface Reconstructions and Metal Growth on Oxides
- Atoms and Molecules on TiO2(110) and CeO2(111) Surfaces-. NC-AFM Imaging of Adsorbed Molecules
- Organic Molecular Films
- Single-Molecule Analysis
- Low-Temperature Measurements: Principles, Instrumentation, and Application
- Theory of NC-AFM
- Chemical Interaction in NC-AFM on Semiconductor Surfaces
- Contrast Mechanisms on Insulating Surfaces
- Analysis of Microscopy and Spectroscopy Experiments
- Theory of Energy Dissipation into Surface Vibrations
- Measurement of Dissipation Induced by Tip-Sample Interactions.