Secondary Ion Mass Spectrometry SIMS V [E-Book] : Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985 / edited by Alfred Benninghoven, Richard J. Colton, David S. Simons, Helmut W. Werner.
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Full text |
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Personal Name(s): | Benninghoven, Alfred, editor |
Colton, Richard J., editor / Simons, David S., editor / Werner, Helmut W., editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
1986
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Physical Description: |
XXII, 564 p. online resource. |
Note: |
englisch |
ISBN: |
9783642827242 |
DOI: |
10.1007/978-3-642-82724-2 |
Series Title: |
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Springer Series in Chemical Physics ;
44 |
Subject (LOC): |
- I Retrospective
- II Fundamentals
- III Symposium: Detection of Sputtered Neutrals
- IV Detection Limits and Quantification
- V Instrumentation
- VI Techniques Closely Related to SIMS
- VII Combined Techniques and Surface Studies
- VIII Ion Microscopy and Image Analysis
- IX Depth Profiling and Semiconductor Applications
- X Metallurgical Applications
- XI Biological Applications
- XII Geological Applications
- XIII Symposium: Particle-Induced Emission from Organics
- XIV Organic Applications Including Fast Atom Bombardment Mass Spectrometry
- Index of Contributors.