Forces in Scanning Probe Methods [E-Book] / edited by H. J. Güntherodt, D. Anselmetti, E. Meyer
Saved in:
Full text |
|
Personal Name(s): | Anselmetti, Dario, editor |
Güntherodt, Hans-Joachim, editor / Meyer, Ernst, editor | |
Imprint: |
Dordrecht :
Springer Netherlands,
1995
|
Physical Description: |
XIII, 644 p. online resource. |
Note: |
englisch |
ISBN: |
9789401100496 |
DOI: |
10.1007/978-94-011-0049-6 |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
NATO ASI Series, Series E: Applied Sciences ;
286 |
Subject (LOC): |
- to Scanning Probe Methods
- The Nanometer Age: Challenge and Chance
- Instrumentation
- Scanning Probe Microscopy Instrumentation
- Low Temperature Scanning Force Microscopy
- Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope
- Oscillating String as a Force Sensor in Scanning Force Microscopy
- Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy
- Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si
- Nanostethoscopy: a New Mode of Operation of the Atomic Force Microscope
- A Multi-Test Instrument Based on Scanning Probe Technologies
- Hydrophobic Surface Interactions Studied Using a Novel Force Microscope
- Imaging Loal Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy
- Simultaneous AFM and Local Conductivity Imaging
- Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses
- Theory
- Forces in Scanning Probe Microscopy
- Controlled Motion of Xe Atom on Metal Surfaces
- Van der Waals Forces and Probe Geometeries for Some Specific Scanning Force Microscopy Studies
- Atomistic Theory of the Interaction between AFM Tips and Ionic Surfaces
- Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces
- Simulation of SFM Images of Adsorbed C60 and C70 Molecule
- Metallic Adhesion
- Atomic-Scale Metal Adhesion
- Photons
- Photons and Forces I: Light Generates Force
- Photons and Forces II: Forces Influence Light
- Friction
- Interfacial Friction and Adhesion of Wetted Monolayers
- Coherent Phonon Generation in the Process of Friction
- Friction Force Microscopy
- Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers
- Two-Dimensional Atomic-Scale Friction Observed with an AFM
- Normal and Lateral Forces in Friction Force Microscopy
- Nanotribology and Chemical Sensitivity on a Nanometer Scale
- Lateral Force Measurements on Phase Separated Polymer Surfaces
- Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy
- Friction on an Atomic Scale
- Nano and Micromechanics
- Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy
- Nanotribology and its Applications to Magnetic Storage Devices and MEMS
- Lifetime Criteria of Macro- and Microtribological Systems
- Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM
- Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope
- Magnetic Storage and Magnetic Forces
- High-Density Recording Technologies as an Application of SPM
- Applications of Magnetic Force Microscopy
- Magnetic Force Microscopy on Thin Film Magnetic Recording Media
- Analysis of Vortices in Superconductors by Scanning Probe Microscopy
- Applications
- Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM
- Force Microscopy of Heavy Ion Irradiated Materials
- Atomic Force Microscopy as a Tool to Study Surface Roughness Effects In X-Ray Photoelectron Spectroscopy
- Atomic-Resolution Image of GaAs (110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
- Time dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
- Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM
- Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/ LFM
- Atomic Resolution Imaging of ReS2 by AFM/LFM
- Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts
- AFM in Liquids AFM Observations of Si (111) in Solutions
- Atomic Scale Force Mapping with the Atomic Force Microscope
- Organics and Biology
- Imaging Chemical Bonds by SPM
- Study of Thin Organic Films by Various Scanning Force Microscopes
- Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au (111) under Applied Load
- Organic Interface Inspection by Scanning Force Microscopy
- Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects
- Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy
- Measuring Molecular Adhesion with Force Microscopy
- Author-index
- Subject-index.