Material Characterization Using Ion Beams [E-Book] / edited by J. P. Thomas, A. Cachard.
The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physic...
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Full text |
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Personal Name(s): | Cachard, A., editor |
Thomas, J. P., editor | |
Imprint: |
Boston, MA :
Springer,
1978
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Physical Description: |
XVIII, 517 p. 79 illus. online resource. |
Note: |
englisch |
ISBN: |
9781468408560 |
DOI: |
10.1007/978-1-4684-0856-0 |
Series Title: |
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NATO Advanced Study Institutes Series, Series B: Physics ;
28 |
Subject (LOC): |
- I Ion Beams: Production and Interaction with Matter
- Energy Loss of Charged Particles
- Some General Considerations of Ion Beam Production and Manipulation
- II Surface Studies: keV Range Ions
- Applications of Low-Energy Ion Scattering
- Ion Beam Induced Light Emission: Mechanisms and Analytical Applications
- Complementary Analysis Techniques: AES, ESCA
- III In-Depth Analysis
- Fundamental Aspects of Ion Microanalysis
- Ion Induced X-rays: General Description
- The Evolving Use of Electrons, Protons and Heavy Ions in the Characterisation of Materials
- Backscattering of Ions With Intermediate Energies
- Backscattering Analysis With MeV 4He Ions
- Microanalysis by Direct Observation of Nuclear Reactions
- IV Solid State Studies Using Channeling Effects
- Channeling: General Description
- Flux Peaking — Lattice Location
- Analysis of Defects by Channeling
- Application of MeV Ion Channeling to Surface Studies
- General Conclusions
- General Conclusions
- Participants.