Transmission Electron Microscopy [E-Book] : A Textbook for Materials Science / by David B. Williams, C. Barry Carter.
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible di...
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Full text |
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Personal Name(s): | Williams, David B., author |
Carter, C. Barry, author | |
Imprint: |
Boston, MA :
Springer,
1996
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Physical Description: |
XXIX, 729 p. 1722 illus. online resource. |
Note: |
englisch |
ISBN: |
9781475725193 |
DOI: |
10.1007/978-1-4757-2519-3 |
Subject (LOC): |
- 1 The Transmission Electron Microscope
- 2 Scattering and Diffraction
- 3 Elastic Scattering
- 4 Inelastic Scattering and Beam Damage
- 5 Electron Sources
- 6 Lenses, Apertures, and Resolution
- 7 How to “See” Electrons
- 8 Pumps and Holders
- 9 The Instrument
- 10 Specimen Preparation
- 11 Diffraction Patterns
- 12 Thinking in Reciprocal Space
- 13 Diffracted Beams
- 14 Bloch Waves
- 15 Dispersion Surfaces
- 16 Diffraction from Crystals
- 17 Diffraction from Small Volumes
- 18 Indexing Diffraction Patterns
- 19 Kikuchi Diffraction
- 20 Obtaining CBED Patterns
- 21 Using Convergent-Beam Techniques
- 22 Imaging in the TEM
- 23 Thickness and Bending Effects
- 24 Planar Defects
- 25 Strain Fields
- 26 Weak-Beam Dark-Field Microscopy
- 27 Phase-Contrast Images
- 28 High-Resolution TEM
- 29 Image Simulation
- 30 Quantifying and Processing HRTEM Images
- 31 Other Imaging Techniques
- 32 X-ray Spectrometry
- 33 The XEDS-TEM Interface
- 34 Qualitative X-ray Analysis
- 35 Quantitative X-ray Microanalysis
- 36 Spatial Resolution and Minimum Detectability
- 37 Electron Energy-Loss Spectrometers
- 38 The Energy-Loss Spectrum
- 39 Microanalysis with Ionization-Loss Electrons
- 40 Everything Else in the Spectrum
- Acknowledgements for Figures.