X-Ray Microscopy and Spectromicroscopy [E-Book] : Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996 / edited by Jürgen Thieme, Günter Schmahl, Dietbert Rudolph, Eberhard Umbach.
This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instr...
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Full text |
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Personal Name(s): | Rudolph, Dietbert, editor |
Schmahl, Günter, editor / Thieme, Jürgen, editor / Umbach, Eberhard, editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
1998
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Physical Description: |
XIX, 383 p. 400 illus. online resource. |
Note: |
englisch |
ISBN: |
9783642721069 |
DOI: |
10.1007/978-3-642-72106-9 |
Subject (LOC): |
- X-Ray Microscopy Projects
- X-Ray Microscopy Applications
- Microspectroscopy and Spectromicroscopy
- X-Ray Optics
- X-Ray Sources.