Surface X-Ray and Neutron Scattering [E-Book] : Proceedings of the 2nd International Conference, Physik Zentrum, Bad Honnef, Fed. Rep. of Germany, June 25–28, 1991 / edited by Hartmut Zabel, Ian K. Robinson.
Owing to the increased availability of synchrotron sources, surface X-ray scattering is a rapidly expanding technique with important applications to surface structures and surface phase transitions, roughening of surfaces and interfaces, and the structure of liquid surfaces, including polymers, liqu...
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Full text |
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Personal Name(s): | Robinson, Ian K., editor |
Zabel, Hartmut, editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
1992
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Physical Description: |
XI, 256 p. online resource. |
Note: |
englisch |
ISBN: |
9783642771446 |
DOI: |
10.1007/978-3-642-77144-6 |
Series Title: |
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Springer Proceedings in Physics ;
61 |
Subject (LOC): |
- Conference Summary
- I Surface Crystallography and Phase Transitions
- Surface X-Ray Crystallography and STM Images
- Determination of Metal Adsorbed Surfaces by X-Ray Diffraction
- Au Adsorption on Si(111) Studied by Grazing Incidence X-Ray Diffraction
- Grazing Incidence X-Ray Scattering Study of Staircases of Steps on Si(001) Surfaces
- Structure and Phase Transitions of Ge(111) and Si(111) Surfaces at High Temperatures
- Anomalous Scattering Applied to Co/Si(111) Interface Structure
- X-Ray Reflectivity Studies of Au Surfaces
- Crystal Truncation Rod as a Convolution of Three-Dimensional Bravais Lattice with X-Ray Reflectivity
- Extended X-Ray Reflectivity Analysis of Si(111)7×7
- Critical Phenomena at Surfaces and Interfaces
- Surface-Induced Order Observed on a Cu3Au(001) Surface
- Thermal Dynamics of (110) fcc Metal Surfaces
- Facet Coexistence in the Roughening Transition of Ag(110)
- Kinetics of Ordering with Random Impurities: Pb on Ni(001)
- II Reflectivity
- Anomalous Reflectivity: A New Method for Determining Density Profiles of Thin Films
- Specular and Diffuse Scattering Studies of Multilayer Interfaces
- Scattering Cross-Section of X-Rays and Neutrons for Grazing Incidence onto Thin Films
- Total Neutron Reflection: Experiments and Analysis
- Profile Refinement in Neutron Reflectivity and Grazing Angle Diffraction
- III Surface X-Ray Standing Waves
- X-Ray Standing Wave Studies of the Liquid/Solid Interface and Ultrathin Organic Films
- Glancing-Incidence X-Ray Analysis of Layered Materials
- Investigation of the Heavy-Atom Distribution in a Langmuir-Blodgett Film by an X-Ray Total External Reflection and Fluorescence Study
- A Structural Investigation of an Ultra-Thin Langmuir-Blodgett Film by an X-Ray Standing Wave Excited in a LSM Substrate Under the Bragg Diffraction Condition
- IV Liquid Surfaces
- The Structure of Self-Assembled Monolayers
- Behenic Acid as a Structural Model for Fatty Acid Monolayers at the Air/Water Interface: An X-Ray Diffraction Study
- X-Ray Scattering Studies of Organic Monolayers on Electrolytic Solutions: Arachidic Acid on CdCl2
- The Phases of Phosphatidyl Ethanolamine Monolayers
- X-Ray Diffraction Studies of Fatty Acid Monolayers on the Surface of Water
- Protein Recognition Processes at Functionalized Lipid Surfaces: A Neutron Reflectivity Study
- Neutron Reflection from Liquid/Liquid Interfaces
- Polymer Interfaces Analysed on a Nanometer Scale: X-Ray and Neutron Reflectometry
- Neutron Reflection from Polymers Adsorbed at the Solid/Liquid Interface
- V Electrochemistry
- Electrochemical Roughening of Au(110) Single Crystal Electrodes
- VI Thin Films and Multilayers
- Reflectivity Studies of Thin Au Films and Au Bicrystals with Grain Boundaries
- Depth Resolved Diffuse Scattering from Buried CoSi2 Layers in Silicon
- Glancing Angle X-Ray Techniques for the Analysis of Ion Beam Modified Surfaces
- Surface Analysis of Borkron Glass for Neutron Applications
- X-Ray Bragg Reflectivity of ErAs Epitaxial Films
- Measurement of Magnetic Field Penetration Depth in Niobium Polycrystalline Films by the Polarized Neutron Reflection Method
- Neutron Reflectivity Studies on Superconducting, Magnetic and Absorbing Thin Films on the Polarized Neutron Spectrometer at the Pulsed Reactor IBR-2
- Magnetic Properties of Ultrathin Co/Ag Films Investigated by Polarised Neutron Reflection
- Depth Selective Real Structure Analysis of Semiconductor Superlattices Using Grazing Incidence X-Ray Diffraction
- Investigation of Interfaces with Grazing Incidence Neutron Radiation
- Roughness Characterization of the Surface and Interface of MBE-Grown Thin Films
- VII Instrumentation and Methods
- Neutron Diffraction Under Grazing Incidence: Recent Results from the Evanescent Wave Diffractometer
- Analytical Calculation of the Resolution Correction Function for X-Ray Surface Structure Analysis at High Exit Angles
- Neutron Double Crystal Diffractometry — A Precise Method for Surface Investigations
- Index of Contributors.