Transmission Electron Microscopy and Diffractometry of Materials [E-Book] / by Brent Fultz, James M. Howe.
This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif-...
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Full text |
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Personal Name(s): | Fultz, Brent, author |
Howe, James M., author | |
Imprint: |
Berlin, Heidelberg :
Springer,
2001
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Physical Description: |
XIX, 748 p. online resource. |
Note: |
englisch |
ISBN: |
9783662045169 |
DOI: |
10.1007/978-3-662-04516-9 |
Subject (LOC): |
- 1. Diffraction and the X-Ray Powder Diffractometer
- 2. The TEM and its Optics
- 3. Scattering
- 4. Inelastic Electron Scattering and Spectroscopy
- 5. Diffraction from Crystals
- 6. Electron Diffraction and Crystallography
- 7. Diffraction Contrast in TEM Images
- 8. Diffraction Lineshapes
- 9. Patterson Functions and Diffuse Scattering
- 10. High-Resolution TEM Imaging
- 11. Dynamical Theory
- Further Reading
- References and Figures
- A. Appendix
- A.1 Indexed Powder Diffraction Patterns
- A.3 Mass Attenuation Coefficients for Characteristic K?? X-Rays
- A.3 Atomic Form Factors for X-Rays
- A.4 X-Ray Dispersion Corrections for Anomalous Scattering
- A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages
- A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp
- A.7 Stereographic Projections
- A.8 Examples of Fourier Transforms
- A.10 Numerical Approximation for the Voigt Function
- A.11 Debye-Waller Factor from Wave Amplitude
- A.12 Review of Dislocations
- A.13 TEM Laboratory Exercises
- A.13.1 Preliminary — JEOL 2000FX Daily Operation
- A.13.2 Preliminary — Philips 400T Daily Operation
- A.13.6 Laboratory 4 — Contrast Analysis of Defects
- A.14 Fundamental and Derived Constants.