Atomic Force Microscopy [E-Book] / by Bert Voigtländer.
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...
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Full text |
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Personal Name(s): | Voigtländer, Bert, author |
Edition: |
2nd edition 2019 |
Imprint: |
Cham :
Springer,
2019
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Physical Description: |
XIV, 331 pages 157 illustrations, 129 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783030136543 |
DOI: |
10.1007/978-3-030-13654-3 |
Series Title: |
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NanoScience and Technology,
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Subject (ZB): | |
Subject (LOC): |
- Introduction
- Part I: Scanning Probe Microscopy Instrumentation
- Harmonic Oscillator
- Technical Aspects of Scanning Probe Microscopy
- Scanning Probe Microscopy Designs
- Electronics for Scanning Probe Microscopy
- Lock-In Technique
- Data Representation and Image Processing
- Artifacts in SPM
- Work Function, Contact Potential, and Kelvin Probe
- Part II: Atomic Force Microscopy (AFM)
- Forces between Tip and Sample
- Technical Aspects of Atomic Force Microscopy
- Static Atomic Force Microscopy
- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
- Intermittent Contact Mode/Tapping Mode
- Mapping of Mechanical Properties Using Force-Distance
- Frequency Modulation (FM) Mode in Dynamic Atomic Force
- Noise in Atomic Force Microscopy
- Quartz Sensors in Atomic Force Microscopy.