Spectroscopic Ellipsometry for Photovoltaics [E-Book] : Volume 1: Fundamental Principles and Solar Cell Characterization / edited by Hiroyuki Fujiwara, Robert W. Collins.
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid per...
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Full text |
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Personal Name(s): | Collins, Robert W, editor |
Fujiwara, Hiroyuki, editor | |
Edition: |
1st ed. 2018. |
Imprint: |
Cham :
Springer,
2018
|
Physical Description: |
XX, 594 pages 336 illustrations, 266 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783319753775 |
DOI: |
10.1007/978-3-319-75377-5 |
Series Title: |
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Springer Series in Optical Sciences ;
212 |
Subject (LOC): |
- Introduction
- Part I: Fundamental Principles of Ellipsometry
- Measurement Technique of Ellipsometry
- Data Analysis
- Optical Properties of Semiconductors
- Dielectric Function Modeling
- Effect of Roughness on Ellipsometry Analysis
- Part II: Characterization of Materials and Structures
- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon
- Crystalline Silicon Solar Cells
- Amorphous/Crystalline Si Heterojunction Solar Cells
- Optical Properties of Cu(In,Ga)Se2
- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization
- Cu2ZnSn(S,Se)4 and Related Materials
- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics
- High Efficiency III-V Solar Cells
- Organic Solar Cells
- Organic-Inorganic Hybrid Perovskite Solar Cells
- Solar Cells with Photonic and Plasmonic Structures
- Transparent Conductive Oxide Materials
- High-Mobility Transparent Conductive Oxide Layers.