Physikalische Messverfahren zur Charakterisierung von Halbleitermaterialien.
Saved in:
Personal Name(s): | Graff, Klaus. |
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Imprint: |
München :
Zentralstelle für Luftfahrtdokumentation und -information,
1976.
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Physical Description: |
94 S. |
Note: |
deutsch |
Series Title: |
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Bundesministerium für Forschung und Technologie. Forschungsbericht T ;
76-0034. |
Keywords: |
semiconductor : measuring method |
Classification: |
ZB | |
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