Metrology and Physical Mechanisms in New Generation Ionic Devices [E-Book] / by Umberto Celano.
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...
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Full text |
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Personal Name(s): | Celano, Umberto, author |
Edition: |
1st ed. 2016. |
Imprint: |
Cham :
Springer,
2016
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Physical Description: |
XXIV, 175 pages 96 illustrations, 18 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783319395319 |
DOI: |
10.1007/978-3-319-39531-9 |
Series Title: |
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Springer Theses, Recognizing Outstanding Ph.D. Research
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Subject (LOC): |
- Introduction
- Filamentary-Based Resistive Switching
- Nanoscaled Electrical Characterization
- Conductive Filaments: Formation, Observation and Manipulation
- Three-Dimensional Filament Observation
- Reliability Threats in CBRAM
- Conclusions and Outlook. .