High spatial resolution and three-dimensional measurement of charge density and electric field in nanoscale materials using off-axis electron holography [E-Book] / Fengshan Zheng
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Full text JuSER |
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Personal Name(s): | Zheng, Fengshan, author |
Imprint: |
Jülich :
Forschungszentrum, Zentralbibliothek,
2020
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Physical Description: |
1 Online-Ressource (XIX, 182 Seiten) |
Note: |
englisch |
ISBN: |
9783958064768 |
Series Title: |
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Schriften des Forschungszentrums Jülich. Reihe Schlüsseltechnologien / key technologies ;
221 |
Dissertation Note: |
Zugleich: Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, 2020
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Subject (ZB): | |
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Shelf Classification: |
Description not available. |