Scanning Probe Microscopy [E-Book] : The Lab on a Tip / by Ernst Meyer, Roland Bennewitz, Hans J. Hug.
Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physica...
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Full text |
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Personal Name(s): | Meyer, Ernst, author |
Bennewitz, Roland, author / Hug, Hans J., author | |
Edition: |
2nd edition 2021. |
Imprint: |
Cham :
Springer,
2021
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Physical Description: |
XIV, 322 pages 194 illustrations, 89 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783030370893 |
DOI: |
10.1007/978-3-030-37089-3 |
Series Title: |
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Graduate Texts in Physics
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Classification: |
- Introduction to Scanning Probe Microscopy
- Overview
- Basic Concepts
- Introduction to Scanning Tunneling Microscopy
- Tunneling: A Quantum-Mechanical Effect
- Instrumental Aspects
- Resolution Limits
- Observation of Confined Electrons
- Spin-Polarized Tunneling
- Observation of the Kondo Effect and Quantum Mirage
- Force Microscopy
- Concept and Instrumental Aspects
- Relevant Forces
- Operation Modes in Force Microscopy
- Contact Force Microscopy
- Dynamic Force Microscopy
- Tapping Mode Force Microscopy
- Further Modes of Force Microscopy
- Force Resolution and Thermal Noise
- High-speed AFM
- Multifrequency AFM
- MFM and Related Techniques
- MFM Operation Modes
- Contrast Formation
- Magnetic Resonance Force Microscopy
- Other Members of the SPM Family
- Artifacts in SPM
- Future Aspects of SPM.