Experimental methods. Pt. A.
Saved in:
Personal Name(s): | Herman, H., editor |
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Imprint: |
New-York, NY :
Academic Pr.,
1980.
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Physical Description: |
XII, 263 S. |
Note: |
englisch |
ISBN: |
0123418194 9780123418197 |
Series Title: |
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Treatise on materials science and technology ;
19. |
Keywords: |
the measurement of residual stress by x-ray diffraction techniques investigation of composition variations by diffraction the use of Moessbauer spectroscopy in materials science photoluminescence techniques for studies of composition and defects in semiconductors materials production by high rate sputter deposition |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: FHA 003A Barcode: 1080002621 Available |