GaN HEMT modeling including trapping effects based on Chalmers model and pulsed S-parameter measurements [E-Book] / vorgelegt von Peng Luo.
Saved in:
Full text |
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Personal Name(s): | Luo, Peng, author |
Imprint: |
Gottingen :
Cuvillier Verlag,
2018
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Physical Description: |
1 online resource (160 pages) |
Note: |
englisch |
ISBN: |
9783736999060 9783736989061 |
Subject (LOC): |
Description not available. |