Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / R. F. Egerton
Saved in:
Table of Contents |
|
Personal Name(s): | Egerton, R. F., author |
Edition: |
Second edition |
Imprint: |
Cham :
Springer,
2016
|
Physical Description: |
XI, 196 Seiten |
Note: |
englisch |
ISBN: |
9783319398761 |
Subject (ZB): | |
Classification: |
IAS-9 | |
---|---|
Institute Call number: B 104554'02' Barcode: 1223100445 Available |