Frontiers of Quality Electronic Design (QED) [E-Book] : AI, IoT and Hardware Security / edited by Ali Iranmanesh.
Quality Electronic Design (QED)'s landscape spans a vast region where territories of many participating disciplines and technologies overlap. This book explores the latest trends in several key topics related to quality electronic design, with emphasis on Hardware Security, Cybersecurity, Machi...
Saved in:
Full text |
|
Personal Name(s): | Iranmanesh, Ali, editor |
Edition: |
1st edition 2023. |
Imprint: |
Cham :
Springer,
2023
|
Physical Description: |
XX, 679 pages 372 illustrations, 275 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783031163449 |
DOI: |
10.1007/978-3-031-16344-9 |
Subject (LOC): |
- Chapter 1. NAND Flash Memory Devices Security Enhancement Based on Physical Unclonable Functions
- Chapter 2. ReRAM based Neuromorphic Computing
- Chapter 3. Flash Technology for VLSI Design
- Chapter 4. Non-volatile memory Technologies:Characteristics,Deployment and Research Challenges
- Chapter 5. Data Analytics and Machine Learning for Coverage Closure
- Chapter 6. Cell-Aware Model Generation by Using Machine Learning
- Chapter 7. Neuromorphic Computing: A Path to Artificial Intelligence through Emulating Human Brains
- Chapter 8. AI for Cybersecurity in Distributed Automotive IoT Systems
- Chapter 9. Ultra-low Power Implementation of Neural Networks Using Inverter-based Memristive Crossbars
- Chapter 10. AI based Hardware Security Methods for Internet-of-Things Applications
- Chapter 11. Enabling Edge Computing Using Emerging Memory Technologies: From Device to Architecture
- Chapter 12. IoT Commercial, Industrial Applications and AI-powered IoT
- Chapter 13. Hardware and System Security - Attacks and Coun- termeasures Against Hardware Trojans
- Chapter 14. FPGA Security: Security Threats from Untrusted FPGA CAD Toolchain
- Chapter 15. DoS Attack Models and Mitigation Frameworks for NoC-based SoCs
- Chapter 16. Defense against security threats with regard to SoC Life Cycle
- Chapter 17. Defect Diagnosis Techniques for Silicon Customer Returns.