Applied charged particle optics. B / A. Septier Hrsg.
Saved in:
Personal Name(s): | Septier, A., editor |
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Imprint: |
New-York,NY :
Academic Pr.,
1980
|
Physical Description: |
XVII, 392 S. |
Note: |
englisch |
ISBN: |
9780120145744 012014574X |
Series Title: |
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Advances in electronics and electron physics ;
Suppl. 13B |
Keywords: |
microanalysis : secondary ion emission electron beam : application |
Subject (ZB): | |
Classification: |
ZB | |
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Open Stacks Call number: S 000100-SUPPL.0013B'01' Barcode: 1081000685 Available |