This title appears in the Scientific Report :
2023
Please use the identifier:
http://dx.doi.org/10.1017/S1431927622009692 in citations.
Please use the identifier: http://hdl.handle.net/2128/34058 in citations.
Atomic Resolution Investigation of Ultra-Low Energy Ion-Implanted Monolayer TMDs Using Scanning Transmission Electron Microscopy
Atomic Resolution Investigation of Ultra-Low Energy Ion-Implanted Monolayer TMDs Using Scanning Transmission Electron Microscopy
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Personal Name(s): | Hennessy, Michael (Corresponding author) |
---|---|
Moynihan, Eoin / O'Connell, Eoghan / Rost, Stefan / Auge, Manuel / Bui, Minh / Kardynal, Beata / Hofsäss, Hans / Bangert, Ursel | |
Contributing Institute: |
Halbleiter-Nanoelektronik; PGI-9 Quanten-Theorie der Materialien; PGI-1 |
Published in: | Microscopy and microanalysis, 28 (2022) S1, S. 2538 - 2540 |
Imprint: |
New York, NY
Cambridge University Press
2022
|
Physical Description: |
2538-2540 |
DOI: |
10.1017/S1431927622009692 |
Conference: | Microscopy and Microanalysis 2022, Oregon (USA), 2022-07-31 - 2022-08-04 |
Document Type: |
Contribution to a conference proceedings Journal Article |
Research Program: |
Quantum Networking |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/34058 in citations.
Description not available. |