This title appears in the Scientific Report :
2024
Please use the identifier:
http://dx.doi.org/10.1063/5.0188573 in citations.
Please use the identifier: http://dx.doi.org/10.34734/FZJ-2024-01529 in citations.
Accurate Evaluation Method for HRS Retention of VCM ReRAM
Accurate Evaluation Method for HRS Retention of VCM ReRAM
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Personal Name(s): | Kopperberg, N. |
---|---|
Wouters, D. J. / Waser, R. / Menzel, S. / Wiefels, S. (Corresponding author) | |
Contributing Institute: |
Elektronische Materialien; PGI-7 JARA-FIT; JARA-FIT |
Published in: | APL materials, 12 (2024) 3, S. 031112 |
Imprint: |
Melville, NY
AIP Publ.
2024
|
DOI: |
10.1063/5.0188573 |
DOI: |
10.34734/FZJ-2024-01529 |
Document Type: |
Journal Article |
Research Program: |
Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - Memristive Materials and Devices |
Link: |
Get full text OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.34734/FZJ-2024-01529 in citations.
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