This title appears in the Scientific Report :
2024
Experimental Characterization and 1D KMC-Based Simulation of the Reliability of 28 nm BEOL Integrated VCM ReRAM
Experimental Characterization and 1D KMC-Based Simulation of the Reliability of 28 nm BEOL Integrated VCM ReRAM
Saved in:
Personal Name(s): | Kopperberg, N. |
---|---|
Wiefels, Stefan / Hofmann, K. / Otterstedt, J. / Wouters, D. J. / Waser, R. / Menzel, Stephan | |
Contributing Institute: |
Elektronische Materialien; PGI-7 JARA-FIT; JARA-FIT |
Imprint: |
2024
|
Conference: | Materials Research Society Spring Meeting, Seattle (USA), 2024-04-22 - 2024-04-26 |
Document Type: |
Conference Presentation |
Research Program: |
NeuroSys: Memristor Crossbar Architekturen (Projekt A) - A Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - Memristive Materials and Devices |
Publikationsportal JuSER |
Description not available. |