This title appears in the Scientific Report :
2010
Please use the identifier:
http://dx.doi.org/10.1088/0953-2048/23/9/095007 in citations.
Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer
Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer
We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d(1) and d(2) in both halves were varied to obtain different combinations of positive and negative cri...
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Personal Name(s): | Weides, M. |
---|---|
Peralagu, U. / Kohlstedt, H. / Pfeifer, J. / Kemmler, M. / Gürlich, C. / Goldobin, E. / Koelle, D. / Kleiner, R. | |
Contributing Institute: |
Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT |
Published in: | Superconductor science and technology, 23 (2010) S. 095007 |
Imprint: |
Bristol
IOP Publ.
2010
|
Physical Description: |
095007 |
DOI: |
10.1088/0953-2048/23/9/095007 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Superconductor Science and Technology
23 |
Subject (ZB): | |
Publikationsportal JuSER |
We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d(1) and d(2) in both halves were varied to obtain different combinations of positive and negative critical current densities j(c), 1 and j(c), 2. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves. |