This title appears in the Scientific Report :
2012
Investigation of structure and resistive switching in ZrO2/TiO2 films grown by atomic layer deposition
Investigation of structure and resistive switching in ZrO2/TiO2 films grown by atomic layer deposition
Saved in:
Personal Name(s): | Kärkkänen, I. |
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Heikkilä, M. / Niinistö, J. / Ritala, M. / Leskelä, M. / Hoffmann-Eifert, S. / Waser, R. | |
Contributing Institute: |
JARA-FIT; JARA-FIT Elektronische Materialien; PGI-7 |
Published in: |
2nd Winterschool of Enhance |
Imprint: |
2012
|
Conference: | Helsinki, Finland 2012-01-09 |
Document Type: |
Conference Presentation |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |