This title appears in the Scientific Report :
2010
Development of tailored measurement tips to characterize current sensitive resistive cells
Development of tailored measurement tips to characterize current sensitive resistive cells
Saved in:
Personal Name(s): | Lentz, F. |
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Kügeler, C. / Bruchhaus, R. / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT |
Published in: |
Nanoelectronics Days |
Imprint: |
2010
|
Conference: | Aachen 2010-10-04 |
Document Type: |
Poster |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |