This title appears in the Scientific Report :
2000
Please use the identifier:
http://hdl.handle.net/2128/845 in citations.
Analysis of X-ray reflectivity data from low-contrast polymer bilayers using a Fourier method
Analysis of X-ray reflectivity data from low-contrast polymer bilayers using a Fourier method
Saved in:
Personal Name(s): | Seeck, O. H. |
---|---|
Kaendler, I. D. / Sinha, S. K. / Tolan, M. / Shin, K. / Rafailovich, M. H. / Sokolov, J. / Kolb, R. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Applied physics letters, 76 (2000) S. 2713 - 2715 |
Imprint: |
Melville, NY
American Institute of Physics
2000
|
Physical Description: |
2713 - 2715 |
Document Type: |
Journal Article |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung Polymere, Membranen und komplexe Flüssigkeiten |
Series Title: |
Applied Physics Letters
76 |
Link: |
OpenAccess |
Publikationsportal JuSER |
Description not available. |