This title appears in the Scientific Report :
2012
Advanced electrical impedance tomography system with high phase accuracy
Advanced electrical impedance tomography system with high phase accuracy
Saved in:
Personal Name(s): | Zimmermann, Egon |
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Huisman, J. A. / Kemna, A / Berwix, Joachim / Glaas, Walter / Meier, Heinrich / Wolters, Bernd / Esser, Odilia | |
Contributing Institute: |
Zentralinstitut für Elektronik; ZEL Agrosphäre; IBG-3 |
Imprint: |
2010
|
Physical Description: |
583-591 |
Conference: | 6th World Congress on Industrial Process Tomography, Bejing (China), 2010-09-06 - 2010-09-09 |
Document Type: |
Contribution to a conference proceedings |
Research Program: |
Modelling and Monitoring Terrestrial Systems: Methods and Technologies |
Publikationsportal JuSER |
Description not available. |