This title appears in the Scientific Report :
2012
Advanced electrical impedance tomography system with high phase accuracy
Advanced electrical impedance tomography system with high phase accuracy
Saved in:
Personal Name(s): | Zimmermann, Egon (Corresponding author) |
---|---|
Huisman, J. A. / Kemna, A. / Berwix, Joachim / Glaas, Walter / Meier, Heinrich / Wolters, Bernd / Esser, Odilia | |
Contributing Institute: |
Zentralinstitut für Elektronik; ZEL Agrosphäre; IBG-3 |
Imprint: |
2010
|
Conference: | '6th World Congress On Industrial Process Tomography (WCIPT6), Bejing (China), 2010-09-06 - 2010-09-09 |
Document Type: |
Conference Presentation |
Research Program: |
Modelling and Monitoring Terrestrial Systems: Methods and Technologies |
Publikationsportal JuSER |
Description not available. |