This title appears in the Scientific Report :
2010
Elektronenmikroskopie am IEK-6 - SEM, FIB, TEM
Elektronenmikroskopie am IEK-6 - SEM, FIB, TEM
Saved in:
Personal Name(s): | Klinkenberg, M. |
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Contributing Institute: |
Nukleare Entsorgung; IEK-6 |
Published in: |
Helmholtz-Koordinierungstreffe 2010, Forschung zu Endlagersystemen, KIT/INE, FZJ/IEK-6, FZD/IRC |
Imprint: |
2010
|
Conference: | Jülich 2010-11-23 |
Document Type: |
Talk (non-conference) |
Research Program: |
Nukleare Sicherheitsforschung |
Publikationsportal JuSER |
Description not available. |