This title appears in the Scientific Report :
2011
Please use the identifier:
http://dx.doi.org/10.1088/0953-8984/23/1/013001 in citations.
Control Molecule-based Transport for Future Molecular Devices
Control Molecule-based Transport for Future Molecular Devices
In this review, possibilities to modify intentionally the electronic transport properties of metal/molecule/metal devices (MMM devices) are discussed. Here especially the influence of the metal work function, the metal-molecule interface, the molecule dipole and different tunneling mechanisms are co...
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Personal Name(s): | Karthäuser, S. |
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Contributing Institute: |
Elektronische Materialien; PGI-7 JARA-FIT; JARA-FIT |
Published in: | Journal of physics / Condensed matter, 23 (2011) S. 013001 |
Imprint: |
Bristol
IOP Publ.
2011
|
Physical Description: |
013001 |
DOI: |
10.1088/0953-8984/23/1/013001 |
PubMed ID: |
21406815 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Journal of Physics: Condensed Matter
23 |
Subject (ZB): | |
Publikationsportal JuSER |
In this review, possibilities to modify intentionally the electronic transport properties of metal/molecule/metal devices (MMM devices) are discussed. Here especially the influence of the metal work function, the metal-molecule interface, the molecule dipole and different tunneling mechanisms are considered. A route to evaluate the effective surface work function of metal-molecule systems is given and, based on experimental results, an exemplary estimation is performed. The electron transport across different metal-molecule interfaces is characterized by relating transmission coefficients extracted from experimentally derived molecular conductances, decay constants or tunneling barrier heights. Based on the reported results the tunneling decay constant can be assumed to be suitable to characterize intrinsic molecular electron transport properties, while the nature of the metal-molecule contacts is properly described by the transmission coefficient. A clear gradation of transmission efficiencies of metal-anchoring group combinations can be given. |