This title appears in the Scientific Report :
2000
Please use the identifier:
http://hdl.handle.net/2128/855 in citations.
X-ray resonant magnetic scattering from FePd thin films
X-ray resonant magnetic scattering from FePd thin films
Depending on the growth conditions, FePd thin films can display a perpendicular magnetic anisotropy associated with chemical order. In competition with the shape anisotropy, this can lead to striped magnetic domains, with moments perpendicular to the film plane. Under these circumstances, magnetic f...
Saved in:
Personal Name(s): | Dudzik, E. |
---|---|
Dhesi, S. S. / Collins, S. P. / Dürr, H. A. / van der Laan, G. / Chesnel, K. / Belakhovsky, C. H. / Marty, A. / Samson, Y. / Goedkopp, J. B. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Journal of applied physics, 87 (2000) S. 5469 |
Imprint: |
Melville, NY
American Institute of Physics
2000
|
Physical Description: |
5469 |
Document Type: |
Journal Article |
Research Program: |
Elektronische Struktur von Festkörpern, Oberflächen und Schichtsystemen |
Series Title: |
Journal of Applied Physics
87 |
Subject (ZB): | |
Link: |
OpenAccess |
Publikationsportal JuSER |
Depending on the growth conditions, FePd thin films can display a perpendicular magnetic anisotropy associated with chemical order. In competition with the shape anisotropy, this can lead to striped magnetic domains, with moments perpendicular to the film plane. Under these circumstances, magnetic flux closure should occur. The striped domains were studied with soft x-ray resonant magnetic scattering using circularly polarized light to demonstrate the presence of closure domains. Magnetic depth profiling was performed both at the Fe and Pd L-3 edge, by measuring the magnetic diffraction peak intensities versus angle of incidence theta. (C) 2000 American Institute of Physics. [S0021-8979(00)65408-7]. |