This title appears in the Scientific Report :
2011
Please use the identifier:
http://dx.doi.org/10.1016/j.jallcom.2011.03.015 in citations.
High quality TbMnO3 films deposited on YAlO3
High quality TbMnO3 films deposited on YAlO3
High quality thin films of TbMnO3 were grown by pulsed laser deposition on orthorhombicYAlO(3) (1 0 0). The interface and surface roughness of a 55 nm thick film were probed by X-ray reflectometry and atomic force microscopy, yielding a roughness of 1 nm. X-ray diffraction revealed untwinned films a...
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Personal Name(s): | Glavic, A. |
---|---|
Voigt, J. / Perßon, J. / Su, Y. / Schubert, J. / de Groot, J. / Zande, W. / Brückel, T. | |
Contributing Institute: |
JCNS-FRM-II; JCNS-FRM-II JARA-FIT; JARA-FIT Streumethoden; JCNS-2 Streumethoden; PGI-4 Neutronenstreuung; JCNS-1 Halbleiter-Nanoelektronik; PGI-9 |
Published in: | Journal of alloys and compounds, 509 (2011) S. 5061 - 5063 |
Imprint: |
Lausanne
Elsevier
2011
|
Physical Description: |
5061 - 5063 |
DOI: |
10.1016/j.jallcom.2011.03.015 |
Document Type: |
Journal Article |
Research Program: |
Großgeräte für die Forschung mit Photonen, Neutronen und Ionen (PNI) Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Journal of Alloys and Compounds
509 |
Subject (ZB): | |
Publikationsportal JuSER |
High quality thin films of TbMnO3 were grown by pulsed laser deposition on orthorhombicYAlO(3) (1 0 0). The interface and surface roughness of a 55 nm thick film were probed by X-ray reflectometry and atomic force microscopy, yielding a roughness of 1 nm. X-ray diffraction revealed untwinned films and a small mosaic spread of 0.04 degrees and 0.2 degrees for out-of-plane and in-plane reflections, respectively. This high degree of epitaxy was also confirmed by Rutherford backscattering spectrometry. Using polarized neutron diffraction we could identify a magnetic structure with the propagation vector (0 0.27 0), identical to the bulk magnetic structure of TbMnO3. (C) 2011 Elsevier B.V. All rights reserved. |