Grootoonk, B., Woerdenweber, J., Gordijn, A., Gabriel, O., & Meier, M. (2014). Monitoring of powder formation via optical emission spectroscopy and self-bias-voltage measurements for high depletion µc-Si: H deposition regimes. Ottawa, Ontario: NCR Research Press.

Grootoonk, B., J. Woerdenweber, A. Gordijn, O. Gabriel, andfavorite Matthias Meier. Monitoring of Powder Formation Via Optical Emission Spectroscopy and Self-bias-voltage Measurements for High Depletion µc-Si: H Deposition Regimes. Ottawa, Ontario: NCR Research Press, 2014.

Grootoonk, B., et al. Monitoring of Powder Formation Via Optical Emission Spectroscopy and Self-bias-voltage Measurements for High Depletion µc-Si: H Deposition Regimes. Ottawa, Ontario: NCR Research Press, 2014.