This title appears in the Scientific Report :
2014
Please use the identifier:
http://dx.doi.org/10.1016/j.jnucmat.2013.01.230 in citations.
Deuterium retention in Toughened, Fine-Grained Recrystallized Tungsten
Deuterium retention in Toughened, Fine-Grained Recrystallized Tungsten
Deuterium retention in Toughened, Fine-Grained Recrystallized W (TFGR W-1.1 wt%TiC) was studied, compared to pure W. D implantation was performed to a fluence of 1 × 1024 m−2 at temperatures of 473–873 K, followed by TDS. It was found that D retention in TFGR W is higher than in pure W at all irradi...
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Personal Name(s): | Oya, M. (Corresponding Author) |
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Uekita, K. / Lee, H. T. / Ohtsuka, Y. / Ueda, Y. / Kurishita, H. / Kreter, A. / Coenen, J. W. / Philipps, V. / Brezinsek, S. / Litnovsky, A. / Sugiyama, K. / Torikai, Y. | |
Contributing Institute: |
Plasmaphysik; IEK-4 |
Published in: | Journal of nuclear materials, 438 (2013) S. S1052 - S1054 |
Imprint: |
Amsterdam [u.a.]
Elsevier Science
2013
|
DOI: |
10.1016/j.jnucmat.2013.01.230 |
Document Type: |
Journal Article |
Research Program: |
Plasma-wall interactions |
Publikationsportal JuSER |
Deuterium retention in Toughened, Fine-Grained Recrystallized W (TFGR W-1.1 wt%TiC) was studied, compared to pure W. D implantation was performed to a fluence of 1 × 1024 m−2 at temperatures of 473–873 K, followed by TDS. It was found that D retention in TFGR W is higher than in pure W at all irradiation temperatures. Namely, at 673 K, D retention in TFGR W is six times higher than pure W. TDS spectrum of TFGR W irradiated at 573 K has a large peak around ∼700 K with small shoulder up to ∼1100 K. In the case of D + He simultaneous irradiation, D retention is about 30% lower than for pure D. In addition, plasma exposure experiment was also conducted in TEXTOR, followed by NRA. Higher retention in TFGR W-1.1 wt%TiC could be attributed to high grain boundary diffusion (then trapping deeper into the bulk) and formation of TiD2. |