This title appears in the Scientific Report :
2011
Please use the identifier:
http://dx.doi.org/10.1016/j.tsf.2011.04.122 in citations.
Modeling of light scattering properties from surface profile in thin-film solar cells by Fourier transform techniques
Modeling of light scattering properties from surface profile in thin-film solar cells by Fourier transform techniques
The optical properties of textured surfaces in the micro and nanometer range are of interest in manifold such as thin-film silicon photovoltaics. Light scattering models, which are based on Fourier transform are applied to calculate both, the angularly resolved scattering and the haze. Therein, topo...
Saved in:
Personal Name(s): | Bittkau, K. |
---|---|
Schulte, M. / Klein, M. / Beckers, T. / Carius, R. | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Published in: | Thin solid films, 519 (2011) S. 6538 - 6543 |
Imprint: |
Amsterdam [u.a.]
Elsevier
2011
|
Physical Description: |
6538 - 6543 |
DOI: |
10.1016/j.tsf.2011.04.122 |
Document Type: |
Journal Article |
Research Program: |
Erneuerbare Energien |
Series Title: |
Thin Solid Films
519 |
Subject (ZB): | |
Publikationsportal JuSER |
The optical properties of textured surfaces in the micro and nanometer range are of interest in manifold such as thin-film silicon photovoltaics. Light scattering models, which are based on Fourier transform are applied to calculate both, the angularly resolved scattering and the haze. Therein, topography, by atomic force microscopy, and the refractive index are used as input data. In this study, these are applied to zinc oxide/air interfaces and to zinc oxide/hydrogenated amorphous silicon interfaces. obtained from zinc oxide/air interfaces are compared to the measured scattering properties. (C) 2011 Elsevier B.V. All rights reserved. |